Types of Semiconductor Reliability and Quality Testing
Intrinsic reliability testing allows test experts to learn how to overcome performance and failure issues, tweak production recipes to mitigate defects, and then fully exploit the beneficial characteristics of the new material. Learn more about the different types of tests needed to qualify semiconductor devices, and which tests are useful for product characterization and quality assurance.
Modular Solutions for Flexible Reliability Testing
The stakes are too high and the development cycle is moving too rapidly to risk setbacks because a chip failed in the field. Enter modular testing solutions pioneered by Accel-RF. Learn more about the important reliability parameters needed to meet market demands and how to incorporate extreme flexibility into your reliability testing solutions.
Our catalog of Datasheets provides product details and specification tables for Accel-RF equipment. Datasheets are available for download on our main website in the Datasheets section.
We provide a library of application notes to address the technical set-up and use of our products, as well as showcase innovative applications for the use of our technology to tackle the toughest semiconductor testing challenges. Application notes can be downloaded by request, please contact firstname.lastname@example.org for details.
How can a device be guaranteed reliable over a typical lifespan measured in years without causing an unacceptable delay in production? To solve this problem, engineers developed the concept of reliability testing.
This webinar provides an in-depth look at everything you need to know regarding GaN reliability. From comparison analysis to understanding failure rates to customized "How-Tos," this webinar covers it all.
It's important to plan your test strategy with your desired end-result in mind. In this demo, you'll get a detailed overview of the reliability testing process, as well as a glimpse into configuring your system to fit your reliability testing needs.