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New entrants into the world of electronic device reliability testing may wonder about the difference between two similar tests: RF-Accelerated Life Test (RF-ALT) and High-Temperature RF Burn-in. The..

All semiconductor devices, whether employed in high-stakes military applications or consumer products, share a common expectation, “reliable operation." Semiconductor devices must perform their..

For a technology to gain wide acceptance, it must first show itself provably reliable for the conditions in which it operates. Gallium Nitride (GaN), as a semiconductor material, is currently at a..

The explosion in the growth of new technologies has increased the demand for solid-state power amplifiers (SSPAs) capable of reliable performance in high-frequency conditions. Gallium-nitride (GaN)..