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Accel-RF has developed an entirely turnkey reliability testing system. Decades of field testing on all types of systems have refined and proven the modular testing system design concept’s..

During a product's development lifecycle, accelerated life testing (ALT) will help find weaknesses early and reduce financial risk. As the product development lifecycle charges ahead, the investment..

Emerging technologies centered primarily on laying the groundwork for 5G are causing IC manufacturers to ramp up their production. As these companies prepare for significantly increased volume..

New entrants into the world of electronic device reliability testing may wonder about the difference between two similar tests: RF-Accelerated Life Test (RF-ALT) and High-Temperature RF Burn-in. The..

The first wonder of modern semiconductor IC designs is their ability to contain highly complex electronic circuitry in such minimal space. Manufacturers of these technological miracles must ensure..

Establishing reliability requirements involves probability statistics, operational lifetime expectation, and a definition of failure. Given a failure criterion, the most direct way to determine..