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New entrants into the world of electronic device reliability testing may wonder about the difference between two similar tests: RF-Accelerated Life Test (RF-ALT) and High-Temperature RF Burn-in. The..

The global wireless network initiative, known as 5G, is fundamentally transforming electronic device testing. Current methodologies will no longer be adequate to do the job. 5G is rapidly approaching..

The electronic semiconductor market is experiencing a growth spurt. New and emerging markets like 5G, Internet of Things (IoT), artificial intelligence (AI), and others are driving integrated circuit..

Reliability testing is of massive importance to the eventual success of any technology. Depending on the chosen testing strategy, devising, setting up and implementing reliability testing systems can..

The first wonder of modern semiconductor IC designs is their ability to contain highly complex electronic circuitry in such minimal space. Manufacturers of these technological miracles must ensure..

Establishing reliability requirements involves probability statistics, operational lifetime expectation, and a definition of failure. Given a failure criterion, the most direct way to determine..

All semiconductor devices, whether employed in high-stakes military applications or consumer products, share a common expectation, “reliable operation." Semiconductor devices must perform their..

For a technology to gain wide acceptance, it must first show itself provably reliable for the conditions in which it operates. Gallium Nitride (GaN), as a semiconductor material, is currently at a..