Conditions are changing rapidly in today's semiconductor manufacturing market. A convergence of emerging technologies — primarily 5G, IoT, AI, and AVs — has forever changed the electronics industry...
Read MoreNew entrants into the world of electronic device reliability testing may wonder about the difference between two similar tests: RF-Accelerated Life Test (RF-ALT) and High-Temperature RF Burn-in. The..
Read MoreThe global wireless network initiative, known as 5G, is fundamentally transforming electronic device testing. Current methodologies will no longer be adequate to do the job. 5G is rapidly approaching..
Read MoreThe electronic semiconductor market is experiencing a growth spurt. New and emerging markets like 5G, Internet of Things (IoT), artificial intelligence (AI), and others are driving integrated circuit..
Read MoreReliability testing is of massive importance to the eventual success of any technology. Depending on the chosen testing strategy, devising, setting up and implementing reliability testing systems can..
Read MoreWhy Test for Reliability in ICs?
The first wonder of modern semiconductor IC designs is their ability to contain highly complex electronic circuitry in such minimal space. Manufacturers of these technological miracles must ensure..
Read MoreEstablishing reliability requirements involves probability statistics, operational lifetime expectation, and a definition of failure. Given a failure criterion, the most direct way to determine..
Read MoreGuide to Burn-In Testing
All semiconductor devices, whether employed in high-stakes military applications or consumer products, share a common expectation, “reliable operation." Semiconductor devices must perform their..
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