In spite of what the cellular phone service providers say, the world will have to wait a few more years to enjoy the benefits of 5G. The network providers are positioning to be the first one out of..
Read MoreNew entrants into the world of electronic device reliability testing may wonder about the difference between two similar tests: RF-Accelerated Life Test (RF-ALT) and High-Temperature RF Burn-in. The..
Read MoreThe global wireless network initiative, known as 5G, is fundamentally transforming electronic device testing. Current methodologies will no longer be adequate to do the job. 5G is rapidly approaching..
Read MoreThe electronic semiconductor market is experiencing a growth spurt. New and emerging markets like 5G, Internet of Things (IoT), artificial intelligence (AI), and others are driving integrated circuit..
Read MoreReliability testing is of massive importance to the eventual success of any technology. Depending on the chosen testing strategy, devising, setting up and implementing reliability testing systems can..
Read MoreWhy Test for Reliability in ICs?
The first wonder of modern semiconductor IC designs is their ability to contain highly complex electronic circuitry in such minimal space. Manufacturers of these technological miracles must ensure..
Read MoreEstablishing reliability requirements involves probability statistics, operational lifetime expectation, and a definition of failure. Given a failure criterion, the most direct way to determine..
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