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Accel-RF Announces New RF-Biased Burn-In Test System

Written by accelAdmin | Mar 12, 2014 9:56:22 PM

Accel-RF Instruments Corporation, the world-leader in supplying equipment for performing measured long-term reliability assessment on compound-semiconductors, announces the expansion of its RFBL measurement equipment with the introduction of an 80-Channel RF Bias Burn-In System.  

See our full New Product Announcement for details!